The Hitachi TM4000Plus II Tabletop SEM is a powerful yet user-friendly imaging and microanalysis tool. This SEM operates at accelerating voltages ranging from 5 to 20 kV and is equipped with an Oxford SDD-EDS detector for rapid, spatially resolved elemental microanalysis. SEM image registration can be performed automatically, and large-area image stitching is also available. Users can acquire both backscattered electron (BSE) and secondary electron (SE) images, enabling simultaneous acquisition of surface morphology and material compositional information. Additionally, users have the option to select high, medium, or low vacuum imaging modes. The integration of an Oxford AZtecLiveLite EDS module facilitates elemental analysis of samples within the SEM, supporting microscale materials characterization. It also features Aztec Large Area Mapping, which enables the acquisition of EDS elemental maps over extensive regions of interest.
- Three Imaging Modes: BSE, SE, BSE/SE Mix
- Low vac mode for uncoated samples
- Acc. Voltage： 5, 10, 15 and 20kV
- Spot Size Current: four modes per kV (12 total) to accommodate any sample
- ZigZag BSE mapping to acquire large-area BSE mosaics
- AZtecLiveLite with Aztec Large Area Mapping
Pierre Haenecour, Lab Manager (Tabletop SEM)
