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Scanning Electron Microscope (SEM)

K-ALFAA houses a newly installed state-of-the-art Hitachi SU8700 scanning electron microscope (SEM). The SU8700 Schottky emitter can operate between 0.1keV and 30 keV. It is equipped with an Oxford Ultim Max Infinity energy-dispersive X-ray spectrometer (EDS) and Symmetry S3 electron backscatter diffractometer (EBSD) unified into the Oxford AZtec software platform. The system enables simultaneous acquisition of EDS and EBSD data.

Jerry Chang, Lab Manager (8700 SEM)
Pierre Haenecour, Instrument Scientist (8700 SEM)

Hitachi SU8700 SEM

Hitachi SU8700